Abstract
Quality Control is the use of technique and activities to achieve, sustain and improve the quality of a product.In a manufacturing sectors,quality control is essential to ensure that the product or service is able to fullfills the customer's requirement and safety. In this project, a ful computerized Quality Control Management System has been developed to assist organization in improving the quality of products and solving the problems of quality control. This system is based on a semi-conductor product. The system has been developed to helped the management team to detect, analyze and choose the best way to assure that their products has fullfilled the needs and spesifications. Technique in the Statistics Process Control like X Bar, C, P , Pareto chart and histogram will be used with Borland Delphi 5 for the system to detect and solve problems that related with product qualities. Output can be displayed on screen and printed to make easier for data analysis of quality control for Texas Instrument (M) Sdn. Bhd.
Website : http://ir.fsksm.utm.my/1550/
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